X-ray fluorescence (XRF) Spectrometer

contact: Ulrike.Troitzsch@anu.edu.au Tel: +61 2 6125 2071

X-ray fluorescence (XRF) Spectrometer

X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.

XRF pressed-pellet and fused-disk making facilities. X-ray fluorescence spectroscopy requires a glass disk to be made by dissolving about 0.3 g of rock powder in molten lithium borate. We also have a press for making pellets from larger amounts (5 g) of rock powder, but are not currently calibrated for such samples.

XRF spectrometer for major and minor elements in whole rocks. XRF cannot be used for very light elements (below F in atomic number, usually), but can quantitatively determine heavier elements down to ppm levels. We are currently calibrated for F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, Mn and Fe, against a suite of about 30 international standard materials. Trace and heavier elements are currently analysed using laser ablation ICP-MS rather than XRF.